HTS541616J9SA00 Hitachi - HDD donor
-
-
-
HDD
DISK DOCTOR
● Country: Czech
S/N: SJCK1U5E
FW: SB4OC70P
Capacity: 160
PCB No: 220 0A28613 01
Date of manufacture: 05.2007
Country: Thailand
Quantity: 1
smartctl 6.6 2016-05-31 r4324 [x86_64-linux-5.4.0-42-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Model Family: Hitachi Travelstar 5K160
Device Model: Hitachi HTS541616J9SA00
Serial Number: SB2404SJCK1U5E
LU WWN Device Id: 5 000cca 525c7c11c
Firmware Version: SB4OC70P
User Capacity: 160.041.885.696 bytes [160 GB]
Sector Size: 512 bytes logical/physical
Device is: In smartctl database [for details use: -P show]
ATA Version is: ATA/ATAPI-7 T13/1532D revision 1
Local Time is: Sat Aug 22 11:26:37 2020 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 645) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 83) minutes.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000b 100 100 062 Pre-fail Always - 0
2 Throughput_Performance 0x0005 100 100 040 Pre-fail Offline - 0
3 Spin_Up_Time 0x0007 229 229 033 Pre-fail Always - 1
4 Start_Stop_Count 0x0012 097 097 000 Old_age Always - 5908
5 Reallocated_Sector_Ct 0x0033 100 100 005 Pre-fail Always - 0
7 Seek_Error_Rate 0x000b 100 100 067 Pre-fail Always - 0
8 Seek_Time_Performance 0x0005 100 100 040 Pre-fail Offline - 0
9 Power_On_Hours 0x0012 085 085 000 Old_age Always - 6828
10 Spin_Retry_Count 0x0013 100 100 060 Pre-fail Always - 0
12 Power_Cycle_Count 0x0032 098 098 000 Old_age Always - 4468
191 G-Sense_Error_Rate 0x000a 100 100 000 Old_age Always - 0
192 Power-Off_Retract_Count 0x0032 100 100 000 Old_age Always - 47
193 Load_Cycle_Count 0x0012 099 099 000 Old_age Always - 11130
194 Temperature_Celsius 0x0002 183 183 000 Old_age Always - 30 (Min/Max 18/59)
196 Reallocated_Event_Count 0x0032 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0022 100 100 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0008 100 100 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x000a 200 253 000 Old_age Always - 0
223 Load_Retry_Count 0x000a 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
-
- Price:29.00$
-
